NEC 2008

The document "NEC 2008" was published on "2022-10-19T15:27:23" on the website "ConfIDent" under the URL https://confident-conference.org/index.php/Event:NEC 2008.

The document "NEC 2008" describes an event in the sense of a conference.

The document "NEC 2008" contains information about the event "NEC 2008" with start date "Mar 24, 2008" and end date "Mar 27, 2008".

The event "NEC 2008" is part of the event series identified by [[]]

Deadlines

2007-10-31

2007-12-17

31 Oct 2007

Abstract

17 Dec 2007

Submission

Venue

Shanghai, China

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The emphasis of this conference will be on fusions of several different fields and applications of Nanoelectronics from design, modeling and fabrication to characterizations and metrology. The conference will also address the education and commercialization of Nanoelectronics.

Authors are invited to submit an abstract of 300-400 words in one or more of the areas identified above. Please submit in word or pdf format with your name and organisation.

Only authors of accepted abstracts must submit full papers that are IEEE pdf Explore compliance. Detailed instructions on making the submitted papers IEEE Xplore compliant can be found below. Please note that the maximum number of pages per extended abstract is restricted to 6.
Topic areas include, but not limited to:

   1. Nanomaterials and Nanostructures
   2. Nanowires and Nanotubes
   3. Nanomagnetics and Spintronics
   4. Nanoscale Modeling & Simulation
   5. Nanophotonics
   6. Nano-devices/Nano-systems and reliability
   7. Nanometrology/Nanomanipulation/Nanofabrication
   8. Carbon Nanotubes
   9. Molecular Electronics
  10. Nano-Bio Systems
  11. Nanotechnology Ventures

Important Dates

Abstract Submission Deadline Extended: 31 Oct 2007
Notification of Extended Summary Acceptance: 15 Nov 2007
Camera Ready Manuscript Submission Deadline: 17 Dec 2007
Author Pre-registration Deadline: 17 Dec 2007
Early Bird Registration Ends: 15 Jan 2008

Authors need to register by 17 December 2007 to ensure that papers are included in the final program and conference proceedings.
	

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